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必威体育登录手机Agilent 8900 ICP-QQQ integrated with IAS Expert PS VPD provides the sensitivity and robustness required for 24/7 contamination control of wafers
| Korean (Korea) | Complete (PDF) |
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| Japanese (Japan) | Complete (PDF) |
Application note for measuring the optical properties of photovoltaic cells using the Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500.
| Chinese (Simplified) (China) | Complete (PDF) |
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必威体育登录手机Application note for investigating the angular dependence of absolute specular reflection using the Agilent Cary 7000 UMS.
| Korean (Korea) | Complete (PDF) |
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| Japanese (Japan) | Complete (PDF) |
| Chinese (Simplified) (China) | Complete (PDF) |
必威体育登录手机Application note for a faster, more accurate way of characterizing cube beamsplitters using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS).
| Korean (Korea) | Complete (PDF) |
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| Japanese (Japan) | Complete (PDF) |
| Chinese (Simplified) (China) | Complete (PDF) |
Contains over 80 methods for the analysis of trace elements in a wide range of sample types across a wide range of industries.
Online calibration using the IAS Automated Standard Addition System (ASAS)
| Japanese (Japan) | Complete (PDF) |
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A guide to the applications of ICP-MS in the semiconductor industry, including the control of metal contaminants.
| Chinese (Simplified) (China) | Complete (PDF) |
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Metallic impurities in trichlorosilane (TCS), an intermediate product used in the production of photovoltaic (PV) silicon, must be strictly controlled in order to produce...
| Chinese (Simplified) (China) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
| Korean (Korea) | Complete (PDF) |
必威体育登录手机Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
| Korean (Korea) | Complete (PDF) |
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| Japanese (Japan) | Complete (PDF) |
Single-digit ppb detection limits for hydride gas contaminants using a single column, single injection volume, and multi-tune method
必威体育登录手机This application brief describes a study that used the exceptional sensitivity and low background of the Agilent 8900 ICP-QQQ to analyze Fe nanoparticles in organic solvents.
| Japanese (Japan) | Complete (PDF) |
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Determination of 25 and 30 nm Fe3O4 NPs in low-particle concentration solutions
Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run
| Japanese (Japan) | Complete (PDF) |
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| Chinese (Simplified) (China) | Complete (PDF) |
Low-ppt determination of alkali metals in high matrix samples using the optional "m-lens"
| Chinese (Simplified) (China) | Complete (PDF) |
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必威体育登录手机Online MSA calibration using prepFAST S automated sample introduction and Agilent 8900 ICP-QQQ
| Chinese (Simplified) (China) | Complete (PDF) |
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A study of non-targeted volatile profiles for classification of the botanical origin of Chinese honey by SPME and GC-MS combined with chemometrics.
| Chinese (Simplified) (China) | Complete (PDF) |
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Direct analysis of sub-ppt to ppt levels of 49 elements in undiluted HNO3 by triple quadrupole ICP-MS (ICP-QQQ).
| Chinese (Simplified) (China) | Complete (PDF) |
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50 elements in HCl were analysed using MS/MS mode to resolve the polyatomic interferences.All analytes could be determined directly in the undiluted HCl with single digit ppt detection limits.
| Chinese (Simplified) (China) | Complete (PDF) |
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Detection limits in the single digit ppt or sub-ppt range were obtained for 48 elements, demonstrating the ability of the 7700s/7900 to routinely measure trace contaminants.
| Publication Part Number | 5990-7914EN | ||
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| Chinese (Simplified) (China) | Complete (PDF) |
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必威体育登录手机Illustrates the advanced analytical performance and robustness of the Agilent 7700s/7900 ICP-MS for the direct determination of metallic impurities in high purity concentrated HCl.
| Publication Part Number | 5990-7354EN | ||
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| Chinese (Simplified) (China) | Complete (PDF) |
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