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UV-Vis & UV-Vis-NIR Spectroscopy (3)
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必威体育登录手机Performance of Compact Visual Displays — Measuring Angular Reflectance of Optically Active Materials Using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS) (PDF)

必威体育登录手机Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe

  • Publication Part Number: 5991-2508EN
  • Created: 10 May 2021
  • 370 KB
  • PDF
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必威体育登录手机Detection of Trace Contamination on Metal Surfaces Using the Handheld Agilent 4100 ExoScan FTIR (PDF)

必威体育登录手机Application note for the detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

  • Publication Part Number: 5990-7799EN
  • Created: 23 Nov 2015
  • 970 KB
  • PDF
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Damage-Free Failure/Defect Analysis in Electronics and Semiconductor Industries Using Micro-ATR FTIR Imaging (PDF)

Application note for Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

  • Publication Part Number: 5991-5223EN
  • Created: 21 Oct 2014
  • 735 KB
  • PDF
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Measuring the Optical Properties of Photovoltaic Cells Using the Cary 5000 UV-Vis-NIR Spectrophotometer and the External DRA-2500 (PDF)

Application note for measuring the optical properties of photovoltaic cells using the Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

  • Publication Part Number: SI-A-1221
  • Created: 06 Feb 2014
  • 139 KB
  • PDF
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The Deep Ultraviolet Spectroscopic Properties of a Next-Generation Photoresist (PDF)

Application note for the deep ultraviolet spectroscopic properties of a next-generation photoresist

  • Publication Part Number: SI-A-1197
  • Created: 06 Feb 2014
  • 187 KB
  • PDF

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