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Application note for measuring the optical properties of photovoltaic cells using the Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Application note for characterization of surface metal contamination on Silicon Wafers Using Surface Metal Extraction ICP-MS
| Chinese (Simplified) (China) | Complete (PDF) |
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必威体育登录手机Application note for Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS
| Chinese (Simplified) (China) | Complete (PDF) |
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Rinse water used in the production of integrated electronic chips can be tested for trace elements by Graphite Furnace AA.
必威体育登录手机Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
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Metallic impurities in semiconductor grade phosphoric acid were determined by a high sensitivity reaction cell ICP-MS.
本研究的目的是找到一種經濟有效的超純水 (UPW) 儲存方法。目標是找到一種低成本材料,該材料不含汙染金屬。
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