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This application note demonstrates the benefits of combining helium collision mode and discrete sampling to develop and validate an easy-to-use, polyatomic interference-free method for the determination of 13 elements in tea infusion.
- Publication Part Number: 5991-3252EN
- Created: 29 May 2023
- 875 KB
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Chinese (Simplified) (United States) | Complete (PDF) |
Chinese (Simplified) (China) | Complete (PDF) |
Chinese (Simplified) (United States) | Complete (PDF) |
ICP-MS method for measuring both major and trace elements in food samples in a single analytical run.
- Publication Part Number: 5991-0107EN
- Created: 21 June 2017
- 420 KB
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English (United States) | Complete (PDF) |
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Korean (Korea) | Complete (PDF) |
Chinese (Simplified) (China) | Complete (PDF) |
Japanese (Japan) | Complete (PDF) |
Portuguese (Brazil) | Complete (PDF) |
Application note for the analysis of Chinese herbal medicines by microwave plasma-atomic emission spectrometry (MP-AES)
- Publication Part Number: 5990-9791EN
- Created: 13 Feb 2014
- 160 KB
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Portuguese (Brazil) | Complete (PDF) |
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Russian (Russia) | Complete (PDF) |
Chinese (Simplified) (China) | Complete (PDF) |
必威体育登录手机Application note for the trace elemental analysis of distilled alcoholic beverages using the Agilent 7700x ICP-MS with octopole collision/reaction cell
- Publication Part Number: 5990-9971EN
- Created: 13 Feb 2014
- 105 KB
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Portuguese (Brazil) | Complete (PDF) |
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Japanese (Japan) | Complete (PDF) |
Chinese (Simplified) (China) | Complete (PDF) |
Application note for Multi-element analysis of crude oil samples by ICP-MS
- Publication Part Number: 5991-3538EN
- Created: 28 Nov 2013
- 971 KB
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Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology
- Publication Part Number: 5991-0876EN
- Created: 17 Apr 2013
- 407 KB
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必威体育登录手机Application note Removal of hydride ion interferences (MH+) on Rare Earth Elements using the Agilent 8800 Triple Quadrupole ICP-MS
- Publication Part Number: 5991-1481EN
- Created: 28 Nov 2012
- 1 MB
Publication Part Number | 5991-1481EN | ||
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Chinese (Simplified) (China) | Complete (PDF) |
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必威体育登录手机Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
- Publication Part Number: 5990-6195EN
- Created: 12 Aug 2010
- 774 KB
Publication Part Number | 5990-6195EN | ||
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