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Laboratory setup and configuration requirements
- Publication Part Number: 8510119300
- Created: 23 May 2022
- 974 KB
必威体育登录手机Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
- Publication Part Number: 5991-2508EN
- Created: 10 May 2021
- 370 KB
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必威体育登录手机Agilent's Fitted Background Correction (FBC) takes the guesswork out of background correction.No matter what your sample challenge may be.
- Created: 06 Nov 2015
- 409 KB
必威体育登录手机The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis.Learn how SVDV works with unique Dichroic Spectral combiner technology.
- Created: 06 Nov 2015
- 575 KB
必威体育登录手机The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis.Learn how SVDV works with unique Dichroic Spectral combiner technology.
- Created: 06 Nov 2015
- 575 KB
In reversed-phase liquid chromatography, pH and ionic strength of the aqueous portion of mobile phases are important in developing rugged method
- Publication Part Number: 5990-9984EN
- Created: 04 June 2015
- 153 KB
Application note for Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
- Publication Part Number: 5991-5223EN
- Created: 21 Oct 2014
- 735 KB
Chinese (Simplified) (United States) | Complete (PDF) |
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Combining signals from two DADs with different path length flow cells, the 1200 Infinity Series HDR-DAD Analyzer enables analysis of main and trace compounds in a single run
- Publication Part Number: 5991-4677EN
- Created: 01 July 2014
- 614 KB
Learn about the benefits of a vertically oriented torch—fast, accurate results, even for your toughest samples
- Created: 29 June 2014
- 972 KB
Application note for monitoring heavy metals by atomic absorption spectroscopy for compliance with RoHS and WEEE Directives
- Publication Part Number: SI-A-1142
- Created: 27 Jan 2014
- 82 KB
必威体育登录手机This Technical Overview describes a LC system with 3 detectors in a multi-user environment operated with Agilent MassHunter Walkup Software for LC/MS and LC systems.
- Publication Part Number: 5991-3198EN
- Created: 01 Oct 2013
- 949 KB
安捷倫科技從未停止對更快、更智能的 CCD 檢測器係列的創新和研發。
- Publication Part Number: 5991-2931CHCN
- Created: 27 Sep 2013
- 1 MB
Detailing methods and practices of FT-IR microscopy and imaging for failure analysis in electronics manufacturing.
- Publication Part Number: SI-00705
- Created: 26 Sep 2012
- 423 KB
必威体育登录手机Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
- Publication Part Number: 5990-6195EN
- Created: 12 Aug 2010
- 774 KB
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Application note for the analysis of electroceramics using laser ablation ICP-MS
- Publication Part Number: 5989-0321EN
- Created: 08 Apr 2004
- 104 KB
必威体育登录手机Agilent's proprietary Fast Automated Curve-fitting Technique (FACT) provides accurate background correction, enabling you to analyze spectrally complex samples with confidence
- Publication Part Number: 5991-4837RU
- Created: 19 Dec 2019
- 245 KB
必威体育登录手机Agilent 5100 ICP-OES 徹底變革了 ICP-OES 分析。5100 SVDV 擁有獨特的智能光譜組合
- Publication Part Number: 5991-4853CHCN
- Created: 01 May 2016
- 306 KB
必威体育登录手机The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis.Learn how SVDV works with unique Dichroic Spectral combiner technology.
- Publication Part Number: 5991-4853RU
- Created: 06 Nov 2015
- 94 KB
了解垂直炬管的優勢 — 快速提供準確結果,輕鬆應對複雜樣品
- Publication Part Number: 5991-4854CHCN
- Created: 21 Oct 2014
- 418 KB
Learn about the benefits of a vertically oriented torch—fast, accurate results, even for your toughest samples
- Publication Part Number: 5991-4854RU
- Created: 08 Aug 2014
- 214 KB