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Metallic impurities in semiconductor grade phosphoric acid were determined by a high sensitivity reaction cell ICP-MS.
- Publication Part Number: 5988-8901EN
- Created: 03 Mar 2003
- 1 MB
Solutions to Win
- Publication Part Number: 5991-6766EN
- Created: 22 Mar 2016
- 1 MB
Application note for characterization of surface metal contamination on Silicon Wafers Using Surface Metal Extraction ICP-MS
- Publication Part Number: 5988-4602EN
- Created: 15 Jan 2014
- 119 KB
Online calibration using the IAS Automated Standard Addition System (ASAS)
- Publication Part Number: 5994-0273EN
- Created: 07 June 2022
- 1 MB
Application note for a comparison of GC-ICP-MS and HPLC-ICP-MS for the Analysis of Organotin Compounds
- Publication Part Number: 5988-6697EN
- Created: 09 Jan 2014
- 506 KB
必威体育登录手机Application note for unmatched spectral interference removal in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode
- Publication Part Number: 5989-4905EN
- Created: 23 Mar 2006
- 159 KB
Japanese (Japan) | Complete (PDF) |
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Application note for the quantification and characterization of Sulfur in Low Sulfur Reformulated Gasolines by GC-ICP-MS
- Publication Part Number: 5988-9880EN
- Created: 01 Aug 2003
- 561 KB
Contains over 80 methods for the analysis of trace elements in a wide range of sample types across a wide range of industries.
- Publication Part Number: 5991-2802EN
- Created: 04 July 2022
- 28 MB
A guide to the applications of ICP-MS in the semiconductor industry, including the control of metal contaminants.
- Publication Part Number: 5991-9495EN
- Created: 01 June 2022
- 7 MB
- Publication Part Number: 5989-7429CHCN
- Created: 22 Sep 2008
- 373 KB
必威体育赛事投注Premium Refurbished Atomic Spectroscopy products provide the ideal combination of robustness, sensitivity and analytical range to handle advanced research applications
必威体育登录手机A timeline of Agilent ICP-MS innovations.
必威体育登录手机Page describes the use of the Agilent Octopole Reaction System (ORS) for ICP-MS to eliminate interferences arising from the plasma and sample matrix.Includes video clips.